This project has received funding from the EUís 7th FP for research, technological development and demonstration under grant agreement no 619871.
The research activities of BASTION can be categorised into basic R&D and technology development (work packages WP1, WP2) and application domains (WP3, WP4). Hence, WP3 and WP4 use the results of WP1 and WP2, while also providing some feedback at a later stage.
The project starts with CMOS ageing effect analysis and modelling, study of field returns and No Failure Found (NFF) problem. These actions are completed in WP1, where the defect universe will be subsequently redefined and novel fault coverage metrics proposed. WP1 can be considered as the most important WP in BASTION as it generates basic knowledge that will be used in all other WPs.
WP2 focuses on embedded instrumentation and instrumentation network topologies. It will receive target fault/defect models from WP1 and use this knowledge for instrumentation design and optimization. In its turn, WP2 will deliver specific fault evoking instruments to WP1 to facilitate defect analysis, and statistical data collection. Actual implementation of instruments in silicon for measurement purposes is also planned, hence creating an important synergy between WP1 and WP2.
The research in WP3 takes results of the ageing study and fault models from WP1 as well as instruments and network topologies from WP2. Based on this knowledge, WP3 will produce a hierarchical in-field test and monitoring system for CMOS ageing and other faults, essentially delivering a failure resilience infrastructure for graceful degradation support under pressure of ageing and wear out. WP3 will also generate a feedback in terms of field learning and new information to take into account in defect modelling and NFF study (WP1).
WP4 combines the main results of all previous WPs. The most important inputs are coming from WP1 in terms of NFF defect classes and test coverage metrics as well as from WP2 in terms of high-speed performance testing instrumentation. WP4 will focus in combining embedded instrumentation and functional test routines in order to shift system-level and board-level test quality to a conceptually new level. WP4 will also reuse chip-level instruments from WP3 and provide functional test routines back to WP3 to improve modular test quality hence creating another synergy point in BASTION.