This project has received funding from the EUís 7th FP for research, technological development and demonstration under grant agreement no 619871.
The BASTION consortium partners will unite their forces to contend the aging and No-Failure-Found (NFF) issues. The project will investigate currently unknown defects, uncertain fault coverage and unclassified field returns. A new defect universe will be assembled and faults will be classified into comprehensive classes. BASTION will study the mechanisms of aging and improve the longevity of electronic products. Embedded instrumentation and the IEEE P1687 standard will be applied to develop a scalable and fast error detection and localization infrastructure.